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dc.contributor.authorMaccaferri Men
dc.contributor.authorMantovani Pen
dc.contributor.authorGiuliani Sen
dc.contributor.authorSanguineti MCen
dc.contributor.authorDemontis Aen
dc.contributor.authorMassi Aen
dc.contributor.authorCorneti Sen
dc.contributor.authorStefanelli Sen
dc.contributor.authorTuberosa Ren
dc.date.accessioned2008-09-12
dc.date.available2008-09-12
dc.date.issued2008-01-01en
dc.identifier.citationThe 11th International Wheat Genetics Symposium proceedings Edited by Rudi Appels, Russell Eastwood, Evans Lagudah, Peter Langridge, Michael Mackay, Lynne McIntyre, and Peter Sharp. Sydney, Sydney University Press, 2008.en
dc.identifier.isbn9781920899141en
dc.identifier.urihttp://hdl.handle.net/2123/3465
dc.publisherSydney University Pressen
dc.relation.ispartofseriesCOPING WITH WHEAT IN A CHANGING ENVIRONMENT BIOTIC STRESSESen
dc.rightsOtheren
dc.subjectWheat geneticsen
dc.subjectWheat breedingen
dc.titleA major genetic factor for durable leaf rust resistance in durum wheat maps in the distal region of chromosome arm 7BLen
dc.typeConference posteren
dc.rights.otherCopyright Sydney University Pressen
usyd.facultySydney University Pressen


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