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dc.contributor.authorTiwari Ren
dc.contributor.authorKumar Yen
dc.contributor.authorPriyamvadaen
dc.contributor.authorSaharan MSen
dc.contributor.authorMishra Ben
dc.date.accessioned2008-09-12
dc.date.available2008-09-12
dc.date.issued2008-01-01en
dc.identifier.citationThe 11th International Wheat Genetics Symposium proceedings Edited by Rudi Appels, Russell Eastwood, Evans Lagudah, Peter Langridge, Michael Mackay, Lynne McIntyre, and Peter Sharp. Sydney, Sydney University Press, 2008.en
dc.identifier.isbn9781920899141en
dc.identifier.urihttp://hdl.handle.net/2123/3302
dc.publisherSydney University Pressen
dc.relation.ispartofseriesCOPING WITH WHEAT IN A CHANGING ENVIRONMENT BIOTIC STRESSESen
dc.rightsOtheren
dc.subjectWheat geneticsen
dc.subjectWheat breedingen
dc.titleMarker assisted approach for incorporating durable rust resistance in popular Indian wheat cultivarsen
dc.typeConference posteren
dc.rights.otherCopyright Sydney University Pressen
usyd.facultySydney University Pressen


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