Show simple item record

FieldValueLanguage
dc.contributor.authorModhej Aen
dc.contributor.authorNaderi Aen
dc.contributor.authorEmam Yen
dc.contributor.authorAyneband Aen
dc.contributor.authorNormohamadi Gen
dc.date.accessioned2008-09-12
dc.date.available2008-09-12
dc.date.issued2008-01-01en
dc.identifier.citationThe 11th International Wheat Genetics Symposium proceedings Edited by Rudi Appels, Russell Eastwood, Evans Lagudah, Peter Langridge, Michael Mackay, Lynne McIntyre, and Peter Sharp. Sydney, Sydney University Press, 2008.en
dc.identifier.isbn9781920899141en
dc.identifier.urihttp://hdl.handle.net/2123/3181
dc.publisherSydney University Pressen
dc.rightsCopyright Sydney University Pressen
dc.subjectWheat geneticsen
dc.subjectWheat breedingen
dc.titleEffects of post-anthesis heat stress and nitrogen levels on grain yield and grain growth of wheat ( T. durum and T. aestivum) genotypesen
dc.typeConference paperen
usyd.facultySydney University Pressen


Show simple item record

Associated file/s

Associated collections

Show simple item record

There are no previous versions of the item available.